UTAMI, Marissa; PUTRA, Erwin Dwika. Development of an Attention-Based Deep Metric Learning Method for Offline Signature Verification in a Limited-Data Environment. JSAI (Journal Scientific and Applied Informatics), [S. l.], v. 9, n. 2, p. 287–293, 2026. DOI: 10.36085/jsai.v9i2.10792. Disponível em: https://jurnal.umb.ac.id/index.php/JSAI/article/view/10792. Acesso em: 18 jul. 2026.